Microscopy and imaging
ZEISS EVO 10 Scanning Electron Microscope with Oxford EDS Detector
- Electron source
- Tungsten filament
- Accelerating voltage
- 0.2 – 30 kV
Instrument category
Microscopy and imaging
Electron microscopy and elemental mapping of surfaces, particles and cross-sections.
Microscopy and imaging at a glance
NAKTEM’s Microscopy and imaging category includes: SEM / EDS. Each instrument page covers the measurement principle, technical specifications, suitable samples and the services offered with it.
Microscopy and imaging
ZEISS EVO 10 Scanning Electron Microscope with Oxford EDS Detector
Nanometre-scale surface morphology imaging with simultaneous elemental mapping by energy-dispersive X-ray spectroscopy.
Instrument category
Common questions about Microscopy and imaging
Which instruments are in the Microscopy and imaging category?
The category includes SEM / EDS. Each one lists its technical specifications and the services offered with it on its own page.
Can I order an analysis instead of using the instrument myself?
Yes. When you create an analysis request we choose the right method and instrument for your sample together with you.
How are prices set?
Related service pages show list prices as a reference. They may change with sample count and extra requests, and the final price is shared in a proposal.
Request analysis on this instrument
Tell us about your sample and the question. Our scientists confirm feasibility and propose a measurement plan.