Analysis
SEM/EDS Imaging and Microanalysis
High-resolution surface imaging by scanning electron microscopy with elemental point, line and map analysis by energy-dispersive X-ray spectroscopy.
In short
High-resolution surface imaging by scanning electron microscopy with elemental point, line and map analysis by energy-dispersive X-ray spectroscopy. The SEM/EDS service combines sub-micrometre morphological imaging with elemental composition analysis on a ZEISS EVO 10 scanning electron microscope equipped with an Oxford Instruments EDS detector.
The SEM/EDS service combines sub-micrometre morphological imaging with elemental composition analysis on a ZEISS EVO 10 scanning electron microscope equipped with an Oxford Instruments EDS detector. Secondary-electron (SE) images reveal topography while backscattered-electron (BSE) images highlight phase contrast; non-conductive samples are either sputter-coated on a Quorum coater or examined uncoated in variable-pressure mode. EDS point analysis, line scans and elemental mapping identify residues, inclusions, coating layers and contamination sources. Typical questions include particle size and shape, pore structure, fracture surface morphology, coating thickness and interface integrity. The service supports automotive, defence, electronics, energy, coatings and academic R&D organisations working with metals, ceramics, polymers, composites, powders and dried biological specimens.
What you receive
SE/BSE micrographs with scale bars and acquisition parameters (TIFF/PNG)
EDS spectra and point/area analysis tables (weight % and atomic %)
Elemental maps and line-scan profiles
Technical report (PDF) covering sample preparation, coating and measurement conditions
Particle size, thickness or porosity measurement tables on request
How it works
Request and scoping
Regions of interest, magnification range, EDS analysis type and reporting needs are defined; sample conductivity and vacuum compatibility are assessed.
Sample reception and preparation
Samples are logged, mounted on stubs and sputter-coated where required; fracture surfaces and powders are prepared representatively.
Measurement
Images are acquired at suitable accelerating voltage and detector settings; EDS spectra, maps and line scans are collected on the defined regions.
Reporting
Results are presented in the standard analysis report; supporting technical documentation is shared on request.
Pricing
€170
per sample
| 1+ | €170 |
| 5+ | €153 |
| 10+ | €136 |
Lead time 3–7 business days
Final pricing depends on sample count, preparation and reporting scope. You receive an itemised proposal.
Prices are a guide and may change with any additional requests. Our team will contact you to confirm the scope and the final price.Request this service
Describe your sample and the decision it supports. We reply with a technical proposal.
Request analysisInstruments used
- SEM / EDS
- ZEISS EVO 10 + Oxford Instruments EDS
- Sputter Coater
- Quorum MiniQS
Questions
Frequently asked questions
How do I send samples for SEM/EDS Imaging and Microanalysis?
Fill in the analysis request form. Our team replies with preparation and shipping instructions for your sample type, and we confirm together that the sample is suitable before you send it.
How long does SEM/EDS Imaging and Microanalysis take?
It depends on the number of samples and laboratory workload. The estimated time on this page is a reference; once we review your request we share a firm schedule.
How is the price set?
The price on this page is a list price. It may change with the number of samples and any additional requests; after we agree the scope, the final price is shared in a proposal.
How do I receive the results?
Results are delivered as a written report. You can follow the status of your request in your account and through email notifications.
Can I request this from abroad?
Yes. We accept requests in Turkish, English, Arabic and Persian, and reply in the language you prefer.
Can I see your quality documents?
We develop our quality processes with reference to ISO/IEC 17025. For the current documents and scope details, contact us and we will send them in writing.
Instruments used
Microscopy and imaging
ZEISS EVO 10 Scanning Electron Microscope with Oxford EDS Detector
Nanometre-scale surface morphology imaging with simultaneous elemental mapping by energy-dispersive X-ray spectroscopy.
Coating and thin film
Quorum MiniQS Sputter Coater
Nanometre-thin gold, gold-palladium or platinum conductive coating of non-conductive specimens ahead of SEM imaging and thin-film studies.
Related services
Analysis
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X-ray diffraction for crystalline phase identification, quantitative phase analysis, crystallite size and degree of crystallinity in powders and solids.
Consulting
Failure Analysis and Materials Consulting
Root-cause determination of fracture, corrosion, coating delamination and product performance problems by multi-technique characterisation and expert review.
Testing
Coating Thickness Testing
Non-destructive thickness measurement of paint, coatings and metallic layers on steel and non-ferrous substrates by magnetic and eddy-current methods.
Training
Instrument Operator Training
Hands-on operator training on analytical instruments including SEM/EDS, XRD, Raman and rheometry, covering sample preparation, measurement and data interpretation.
Further reading
Characterization
SEM/EDS Sample Preparation Guide
Reliable scanning electron microscopy and EDS results begin long before the sample enters the chamber. A hands-on guide to mounting, conductive coating, surface preparation and the mistakes that most often ruin an analysis.
September 22, 20265 min readCharacterization
How to Choose a Particle Size Analysis Method
A practical guide to choosing between laser diffraction, electron microscopy, dynamic light scattering and sieving, based on your sample, your size range and how the result will be used.
September 8, 20265 min read
Request this service
Describe your sample and the decision it supports. We reply with a technical proposal.