Testing
Electrical Sheet Resistance Testing
Four-point probe measurement of sheet resistance, resistivity and conductivity of thin films, conductive coatings and semiconductor wafers.
In short
Four-point probe measurement of sheet resistance, resistivity and conductivity of thin films, conductive coatings and semiconductor wafers. Electrical sheet resistance testing is performed with an Ossila P2010A2 four-point probe system. Current is passed through the outer pair of four collinear probes and voltage measured across the inner pair, which excludes contact resistance and yields sheet resistance (Ω/sq) directly.
Electrical sheet resistance testing is performed with an Ossila P2010A2 four-point probe system. Current is passed through the outer pair of four collinear probes and voltage measured across the inner pair, which excludes contact resistance and yields sheet resistance (Ω/sq) directly. For films of known thickness, resistivity (Ω·cm) and conductivity are calculated with geometric correction factors. Typical samples include transparent conductive oxides such as ITO, graphene and carbon nanotube films, metallic coatings, conductive polymers, printed electronics inks and semiconductor wafers. The service answers how deposition or annealing parameters affect conductivity, how uniform a film is, whether the target sheet resistance has been reached and whether batches are consistent. It serves photovoltaic, display, printed electronics, sensor and nanomaterial organisations.
What you receive
Sheet resistance (Ω/sq) per measurement point with the geometric correction factors applied
Resistivity (Ω·cm) and conductivity (S/cm) for films with supplied thickness
Multi-point uniformity map and statistical summary on request
Method summary covering current, probe spacing, measurement temperature and sample geometry
Raw data (CSV) and PDF report
How it works
Request and scoping
Film type, substrate, expected resistance range, thickness data and the number of measurement points are agreed; the need for an insulating substrate is confirmed.
Sample reception and preparation
Samples are logged, surfaces cleaned, dimensions measured and a suitable placement planned for delicate films sensitive to probe pressure.
Measurement
Multi-point measurements are taken at a suitable current level; current reversal compensates thermoelectric effects and repeatability is checked.
Reporting
Results are presented in the standard analysis report; supporting technical documentation is shared on request.
Pricing
€115
per sample
| 1+ | €115 |
| 10+ | €98 |
Lead time 5–10 business days
Final pricing depends on sample count, preparation and reporting scope. You receive an itemised proposal.
Prices are a guide and may change with any additional requests. Our team will contact you to confirm the scope and the final price.Request this service
Describe your sample and the decision it supports. We reply with a technical proposal.
Request analysisInstruments used
- Four-Point Probe
- Ossila P2010A2
Questions
Frequently asked questions
How do I send samples for Electrical Sheet Resistance Testing?
Fill in the analysis request form. Our team replies with preparation and shipping instructions for your sample type, and we confirm together that the sample is suitable before you send it.
How long does Electrical Sheet Resistance Testing take?
It depends on the number of samples and laboratory workload. The estimated time on this page is a reference; once we review your request we share a firm schedule.
How is the price set?
The price on this page is a list price. It may change with the number of samples and any additional requests; after we agree the scope, the final price is shared in a proposal.
How do I receive the results?
Results are delivered as a written report. You can follow the status of your request in your account and through email notifications.
Can I request this from abroad?
Yes. We accept requests in Turkish, English, Arabic and Persian, and reply in the language you prefer.
Can I see your quality documents?
We develop our quality processes with reference to ISO/IEC 17025. For the current documents and scope details, contact us and we will send them in writing.
Instruments used
Electrochemistry and electrical
Ossila P2010A2 Four-Point Probe Sheet Resistance Measurement System
Contact-resistance-independent measurement of sheet resistance, resistivity and conductivity of thin films, coatings and semiconductor wafers.
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Request this service
Describe your sample and the decision it supports. We reply with a technical proposal.