Electrochemistry and electrical
Ossila P2010A2 Four-Point Probe Sheet Resistance Measurement System
Contact-resistance-independent measurement of sheet resistance, resistivity and conductivity of thin films, coatings and semiconductor wafers.
In short
Contact-resistance-independent measurement of sheet resistance, resistivity and conductivity of thin films, coatings and semiconductor wafers. The Ossila P2010A2 is a benchtop four-point probe system that determines sheet resistance independently of contact and lead resistance by passing current through the outer pair of four equally spaced spring-loaded tips and measuring the voltage across the inner pair.
- Measurement method
- In-line four-point probe (DC)
- Probe spacing
- 1.27 mm
- Probe tips
- Four spring-loaded rounded tips
Services on this instrument
Electrical Sheet Resistance Testing
from €1155–10 business daysRequest this serviceService detailsInstrument Operator Training
from €42014–30 business daysRequest this serviceService details
Overview
The Ossila P2010A2 is a benchtop four-point probe system that determines sheet resistance independently of contact and lead resistance by passing current through the outer pair of four equally spaced spring-loaded tips and measuring the voltage across the inner pair. When film thickness is entered, resistivity and conductivity are calculated automatically; the software applies geometric correction factors and reduces uncertainty through current sweeps and multi-measurement averaging. Typical specimens include conductive polymers, transparent conductive oxides (ITO, FTO), metal coatings, graphene and carbon nanotube films, doped semiconductor wafers and printed electronic layers. The system supports thin-film deposition process optimisation, verification of coating uniformity and electrical quality control in organic electronics, photovoltaics and sensor research.
Measurement principle
Capabilities
Sheet resistance (Ω/sq) measurement independent of contact resistance
Resistivity (Ω·cm) and conductivity (S/cm) calculation from film thickness
Current sweeps and multi-measurement averaging to reduce uncertainty
Geometric correction factors for accurate results on small and thin specimens
Multi-point mapping for coating uniformity assessment
Characterisation of transparent conductive oxide and conductive polymer films
Suitable samples
Transparent conductive oxide coatings (ITO, FTO)
Metal thin films and sputtered coatings
Conductive polymer and carbon-based films
Doped semiconductor wafers
Printed electronics and conductive ink layers
Technical specifications
| Measurement method | In-line four-point probe (DC) |
|---|---|
| Probe spacing | 1.27 mm |
| Probe tips | Four spring-loaded rounded tips |
| Sheet resistance range | From the mΩ/sq to the MΩ/sq range |
| Derived quantities | Resistivity, conductivity (with thickness input) |
| Control and data | PC software with automatic correction factors and CSV export |
Services on this instrument
Electrical Sheet Resistance Testing
from €1155–10 business daysRequest this serviceService detailsInstrument Operator Training
from €42014–30 business daysRequest this serviceService details
- Manufacturer
- Ossila
- Model
- P2010A2
- Catalogue no.
- 25
- Reference standards
- SEMI MF84, SEMI MF390
Quick answers
Four-Point Probe: key facts
What is Ossila P2010A2 Four-Point Probe Sheet Resistance Measurement System used for?
It is used for: Sheet resistance (Ω/sq) measurement independent of contact resistance, Resistivity (Ω·cm) and conductivity (S/cm) calculation from film thickness, Current sweeps and multi-measurement averaging to reduce uncertainty, Geometric correction factors for accurate results on small and thin specimens, Multi-point mapping for coating uniformity assessment, and Characterisation of transparent conductive oxide and conductive polymer films.
Which samples can Ossila P2010A2 Four-Point Probe Sheet Resistance Measurement System analyse?
Suitable samples: Transparent conductive oxide coatings (ITO, FTO), Metal thin films and sputtered coatings, Conductive polymer and carbon-based films, Doped semiconductor wafers, and Printed electronics and conductive ink layers.
Which standards does Ossila P2010A2 Four-Point Probe Sheet Resistance Measurement System relate to?
Relevant standards: SEMI MF84 and SEMI MF390.
Which NAKTEM services use Ossila P2010A2 Four-Point Probe Sheet Resistance Measurement System?
Electrical Sheet Resistance Testing and Instrument Operator Training.
What results do I receive?
Typical deliverables: Sheet resistance (Ω/sq) per measurement point with the geometric correction factors applied, Resistivity (Ω·cm) and conductivity (S/cm) for films with supplied thickness, Multi-point uniformity map and statistical summary on request, Method summary covering current, probe spacing, measurement temperature and sample geometry, and Raw data (CSV) and PDF report.
Related services
Testing
Electrical Sheet Resistance Testing
Four-point probe measurement of sheet resistance, resistivity and conductivity of thin films, conductive coatings and semiconductor wafers.
Training
Instrument Operator Training
Hands-on operator training on analytical instruments including SEM/EDS, XRD, Raman and rheometry, covering sample preparation, measurement and data interpretation.
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