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Spectroscopy and diffraction

Anton Paar XRDynamic 500 X-ray Diffractometer (XRD)

Crystalline phase identification, quantitative phase analysis, crystallite size and non-ambient structural studies on powders and solid materials.

X-ray diffractometer with goniometer and sample stage visible
Photo: Sufangxi via Wikimedia Commons, CC BY-SA 4.0
Operational
EN 13925-1
EN 13925-2
ASTM E915

In short

Crystalline phase identification, quantitative phase analysis, crystallite size and non-ambient structural studies on powders and solid materials. The Anton Paar XRDynamic 500 is a multipurpose powder X-ray diffractometer with a fully automated goniometer and automatic recognition of optical components. It switches between Bragg-Brentano and parallel-beam geometries without manual realignment, and its adjustable goniometer radius lets resolution be balanced against intensity.

Goniometer
Fully automated, adjustable radius
Measurement geometries
Bragg-Brentano and parallel beam
X-ray source
Sealed tube, Cu anode

Services on this instrument

Prices are a guide and may change with any additional requests. Our team will contact you to confirm the scope and the final price.

Overview

The Anton Paar XRDynamic 500 is a multipurpose powder X-ray diffractometer with a fully automated goniometer and automatic recognition of optical components. It switches between Bragg-Brentano and parallel-beam geometries without manual realignment, and its adjustable goniometer radius lets resolution be balanced against intensity. Diffraction patterns provide phase identification, quantitative phase analysis by Rietveld refinement, crystallite size and microstrain, degree of crystallinity, lattice parameters and preferred orientation. Non-ambient sample chambers enable in situ monitoring of phase transformations, thermal expansion and reaction kinetics under controlled temperature, atmosphere and humidity. The system characterises ceramics, cement, minerals, alloys, battery and catalyst materials, pharmaceutical polymorphs and thin films for quality control, raw-material verification and academic research.

Measurement principle

Capabilities

  • Crystalline phase identification by powder diffraction

  • Quantitative phase analysis by Rietveld refinement

  • Crystallite size and microstrain by Scherrer and Williamson-Hall methods

  • Degree of crystallinity and lattice parameter determination

  • In situ measurements under controlled temperature and atmosphere

  • Thin-film analysis in Bragg-Brentano and parallel-beam geometries

Suitable samples

  • Ceramic, cement and mineral powders

  • Metals and alloys

  • Battery and catalyst materials

  • Pharmaceutical actives and polymorphs

  • Nanomaterials and thin films

  • Polymers and semi-crystalline materials

Technical specifications

Anton Paar XRDynamic 500 X-ray Diffractometer (XRD) — Technical specifications
GoniometerFully automated, adjustable radius
Measurement geometriesBragg-Brentano and parallel beam
X-ray sourceSealed tube, Cu anode
Optical componentsAutomatically recognised, alignment-free exchange
Sample stagesMulti-sample changer and non-ambient chambers
Data evaluationPhase search-match, Rietveld refinement

Services on this instrument

Prices are a guide and may change with any additional requests. Our team will contact you to confirm the scope and the final price.
Manufacturer
Anton Paar
Model
XRDynamic 500
Catalogue no.
21
Reference standards
EN 13925-1, EN 13925-2, ASTM E915

Quick answers

XRD: key facts

What is Anton Paar XRDynamic 500 X-ray Diffractometer (XRD) used for?

It is used for: Crystalline phase identification by powder diffraction, Quantitative phase analysis by Rietveld refinement, Crystallite size and microstrain by Scherrer and Williamson-Hall methods, Degree of crystallinity and lattice parameter determination, In situ measurements under controlled temperature and atmosphere, and Thin-film analysis in Bragg-Brentano and parallel-beam geometries.

Which samples can Anton Paar XRDynamic 500 X-ray Diffractometer (XRD) analyse?

Suitable samples: Ceramic, cement and mineral powders, Metals and alloys, Battery and catalyst materials, Pharmaceutical actives and polymorphs, Nanomaterials and thin films, and Polymers and semi-crystalline materials.

Which standards does Anton Paar XRDynamic 500 X-ray Diffractometer (XRD) relate to?

Relevant standards: EN 13925-1, EN 13925-2, and ASTM E915.

Which NAKTEM services use Anton Paar XRDynamic 500 X-ray Diffractometer (XRD)?

XRD Phase Analysis and Instrument Operator Training.

What results do I receive?

Typical deliverables: Diffraction patterns (2θ–intensity) with phase matches marked and peak list, ICDD PDF card numbers for identified phases and quantitative phase fractions, Crystallite size, microstrain and percentage crystallinity (on request), Method summary covering radiation, optics, scan range and step time, and Raw data (XRDML/CSV) and PDF report.

  • Training

    Why Materials Characterization Training Pays Off

    A badly prepared sample, a wrongly chosen parameter or an over-interpreted spectrum can cost far more than the instrument itself. We explain why structured characterization training delivers a tangible return for R&D and quality teams.

    October 27, 20264 min read

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